Representativeness of the density-controlled random circuit generator for benchmarking compilers
Determine whether a gate-density-controlled random circuit generator that allows explicit control of width, depth, and gate density is an effective surrogate for recognized benchmark suites when profiling quantum compiler performance and cost. Ascertain whether the observed discrepancies in average and maximum speedup and in overhead metrics between results on generated circuits and on benchmark-suite circuits arise primarily from differences in circuit scale (width, depth, and density distributions) or from structural characteristics of benchmark circuits that are not captured by the generator.
References
The final open question resulting from the work in this paper concerns the effectiveness of the random circuit generation technique for benchmarking compiler performance and cost, relative to that which would be expected from using a recognised benchmarking suite. An open question, however, is whether this is due to the different scales of circuits produced by the generator, or whether there is a mismatch in some aspect of circuit structure which causes this discrepancy.