Dynamically reconfigurable multi-wavelength interferometry (2502.02506v1)

Abstract: Single-wavelength interferometry achieves high resolution for smooth surfaces but struggles with rough, industrially relevant ones due to limited unambiguous measuring range and speckle effects. Multi-wavelength interferometry addresses these challenges by using synthetic waveleths, enabling a balance between extended measurement range and resolution by combining several synthetic wavelengths. This approach holds immense potential for diverse industrial applications, yet it remains largely untapped due to the lack of suitable light sources. Existing solutions are constrained by limited flexibility in synthetic-wavelength generation and slow switching speeds. We demonstrate a light source for multi-wavelength interferometry based on electro-optic single-sideband modulation. It reliably generates synthetic wavelengths with arbitrary values from centimeters to meters and switching times below 30 ms. This breakthrough paves the way for dynamic, reconfigurable multi-wavelength interferometry capable of adapting to complex surfaces and operating efficiently even outside laboratory settings. These capabilities unlock the full potential of multi-wavelength interferometry, offering unprecedented flexibility and speed for industrial and technological applications.