Diffuse interface models of solidification with convection: The choice of a finite interface thickness

Abstract: The thin interface limit aims at minimizing the effects arising from a numerical interface thickness, inherent in diffuse interface models of solidification and microstructure evolution such as the phase field model. While the original formulation of this problem is restricted to transport by diffusion, we consider here the case of melt convection. Using an analysis of the coupled phase field-fluid dynamic equations, we show here that such a thin interface limit does also exist if transport contains both diffusion and convection. This prediction is tested by comparing simulation studies, which make use of the thin-interface condition, with an analytic sharp-interface theory for dendritic tip growth under convection.