Integration of focused-ion-beam poling with complex photonic architectures

Investigate the integration of focused-ion-beam poling with more complex photonic architectures to extend its use in integrated nonlinear and quantum photonics.

Background

Focused-ion-beam (FIB) poling enables submicrometer-resolution ferroelectric domain engineering in lithium niobate and thin-film lithium-niobate-on-insulator substrates. The method offers faster processing than electron-beam poling, reduced backscattering, compatibility with uneven or structured surfaces, and flexibility to pattern domains before or after waveguide fabrication.

Although the paper describes demonstrations of FIB poling and its compatibility with established semiconductor-processing workflows, it states that integration with more complex photonic architectures has not yet been explored. This unresolved issue concerns how FIB-written domain structures can be incorporated into increasingly elaborate integrated nonlinear and quantum photonic circuits.

References

FIB poling thus provides a versatile means of creating domain patterns in LN and LNOI with submicron resolution. While early demonstrations have confirmed the feasibility of the approach, integration with more complex photonic architectures is yet to be explored. These open questions suggest that further development of FIB poling could yield new opportunities for domain engineering in integrated nonlinear photonics.

— Recent advances in poled lithium niobate  (2609.30736 - Messalea et al., 25 Sep 2026) in Section 3, subsection “Focused ion beam”