Robust estimation based on one-shot device test data under log-normal lifetimes

Published 3 Nov 2022 in stat.AP | (2211.02118v1)

Abstract: In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also developed. Their robustness feature is illustrated through a simulation study and two numerical examples.

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