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Sign Reversal of anisotropic magnetoresistance in La0.7Ca0.3MnO3/STO ultrathin films (1409.7250v1)

Published 25 Sep 2014 in cond-mat.mes-hall and cond-mat.mtrl-sci

Abstract: We present the observation of strain induced sign reversal of anisotropic magnetoresistance (AMR) in LCMO (LCMO) ultrathin films (thickness 4 nm) deposited on STO (001) substrate (STO). We have also observed unusually large AMR in LCMO/STO thin films with thickness of 6 nm below but close to its Curie temperature (TC) which decrease as the film thickness increases. The sign reversal of AMR (with a maximum value of - 6) with magnetic field or temperature for the 4 nm thin film may be attributed to the increase in tensile strain in the plane of the thin film which in turn facilitates the rotation of the magnetization easy axis.

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