Asymptotic bond-dimension scaling and reliability of internal error checks
Determine whether the bond dimension required by the Sweeping RTM algorithm for fixed probability-error threshold ε_p, denoted χ(T, ε_p, N), grows exponentially, subexponentially, or polynomially with circuit time, and establish whether the algorithm’s internal convergence checks suffice to guarantee the stated error.
References
Several questions remain open. The present evidence is numerical and heuristic, therefore rigorous bounds need to be found. In particular, it remains to be fully established whether the growth of the bond dimension at a given thresold $\epsilon_p$, i.e. $\chi(T,\epsilon_p,N)$, is exponential, subexponential, or purely polynomial and if the internal checks for the error provided here are enough.
How the bond dimension needed to pass scales with $n$ is not settled by sizes up to ten.