Determine the origin of the residual step-up transition bump
Determine the exact origin of the small systematic bump that remains in two measured step-up transitions after clear-field–dark-field correction, in order to eliminate the need for manual data shifting and improve the robustness of the detector-lag measurement procedure.
References
The exact origin of this behaviour is currently unknown and may arise from detector synchronisation, x-ray source fluctuations, calibration errors, or other experimental factors. A more detailed investigation of this effect should be conducted in future work to eliminate the need for manual correction and further improve the robustness of the measurement procedure.
— Measuring and Modelling Lag in Amorphous Silicon Flat-Panel X-ray Detectors
(2608.26542 - Huang et al., 27 Aug 2026) in Discussion and future work, Section 7