Determine the origin of the residual step-up transition bump

Determine the exact origin of the small systematic bump that remains in two measured step-up transitions after clear-field–dark-field correction, in order to eliminate the need for manual data shifting and improve the robustness of the detector-lag measurement procedure.

Background

After applying the clear-field–dark-field correction, the authors observed a small systematic bump in two step-up transition measurements. They manually shifted the affected data to align the transitions, but identified several possible causes, including detector synchronisation, x-ray source fluctuations, calibration errors, and other experimental factors.

Because the exact source of this artefact remains unresolved, the authors explicitly call for a more detailed investigation in future work. Resolving it would improve the reliability and reproducibility of the long-duration detector-lag characterisation method.

References

The exact origin of this behaviour is currently unknown and may arise from detector synchronisation, x-ray source fluctuations, calibration errors, or other experimental factors. A more detailed investigation of this effect should be conducted in future work to eliminate the need for manual correction and further improve the robustness of the measurement procedure.

— Measuring and Modelling Lag in Amorphous Silicon Flat-Panel X-ray Detectors  (2608.26542 - Huang et al., 27 Aug 2026) in Discussion and future work, Section 7