Determine the origin of the residual step-up transition bump

Determine the exact origin of the small systematic bump that remains in two measured step-up transitions after clear-field–dark-field correction, in order to eliminate the need for manual data shifting and improve the robustness of the detector-lag measurement procedure.

Background

After applying the clear-field–dark-field correction, the authors observed a small systematic bump in two step-up transition measurements. They manually shifted the affected data to align the transitions, but identified several possible causes, including detector synchronisation, x-ray source fluctuations, calibration errors, and other experimental factors.

Because the exact source of this artefact remains unresolved, the authors explicitly call for a more detailed investigation in future work. Resolving it would improve the reliability and reproducibility of the long-duration detector-lag characterisation method.

References

The exact origin of this behaviour is currently unknown and may arise from detector synchronisation, x-ray source fluctuations, calibration errors, or other experimental factors. A more detailed investigation of this effect should be conducted in future work to eliminate the need for manual correction and further improve the robustness of the measurement procedure.

Measuring and Modelling Lag in Amorphous Silicon Flat-Panel X-ray Detectors  (2608.26542 - Huang et al., 27 Aug 2026) in Discussion and future work, Section 7