Determine the origin of elevated dark-current spots in e2v CCDs

Determine the physical origin of the localized spots of elevated dark current observed near the readout registers of some e2v CCDs.

Background

The paper reports narrow spots of elevated dark current near the readout registers in some e2v CCDs. These spots can exceed 0.1 e− pix−1 s−1 in their central pixels, substantially above the signal attributed to amplifier glow, and appear as peaks offset from the channel edges. Because their physical cause is unresolved, identifying their origin is necessary for understanding detector behavior and for developing appropriate calibration or mitigation procedures.