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Optimality and additive depth scaling for approximate unitary designs

Determine whether ε-approximate unitary k-designs over n qubits with relative error can be generated in circuit depth O(k) + O(log(n/ε)), rather than requiring a multiplicative scaling in k and log(n/ε) as in current constructions, and establish matching upper and lower bounds on the minimal circuit depth as a function of all three parameters n, k, and ε.

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Background

The paper proves that gluing small designs yields ε-approximate unitary k-designs in depth scaling like log(n) times a near-linear function of k, achieving optimal dependence on n and inheriting near-optimal dependence on k from recent constructions. However, the authors point out that the joint optimality in n, k, and ε is unresolved: it may be possible to achieve an additive depth scaling across k and log(n/ε), rather than multiplicative. A definitive characterization would require matching upper and lower bounds that capture the full three-parameter dependence.

References

On the mathematical side, an obvious open question concerns the optimality of our unitary design construction. While we have proven in Proposition~\ref{prop: lower bound design} that our $n$-dependence is optimal, and we inherit the optimal $k$-dependence of Ref. up to poly-logarithmic factors, the relation between these two dependencies is not known. More precisely, we cannot yet rule out the possibility that $\varepsilon$-approximate unitary $k$-designs over $n$ qubits can be created in depth $\mathcal{O}(k) + \mathcal{O}(\log(n / \varepsilon))$, whereas our construction requires a depth of $\tilde{\mathcal{O}(k) \times \mathcal{O}(\log(n / \varepsilon))$. Achieving a matching upper and lower bound on the circuit depth with respect to all three parameters $n, k, \varepsilon$ remains an outstanding challenge.

Random unitaries in extremely low depth (2407.07754 - Schuster et al., 10 Jul 2024) in Discussion