Electron escape probability in ThO2 thin films for conversion-electron clock detection

Determine the escape probability of internal conversion electrons from thorium dioxide (ThO2) thin films and quantify its impact on detection efficiency for conversion-electron-based nuclear clock operation.

Background

The authors propose that a conversion-electron-based nuclear clock using ThO2 thin films is feasible but highlight that detection efficacy could be limited by electron escape probabilities.

They explicitly state that the escape probability needs paper, implying a key experimental and modeling task for future implementation of such a clock.