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Plug-and-Play Stability Certificates Compliant with Black-Box Models of Devices

Published 22 Sep 2026 in eess.SY | (2609.26510v1)

Abstract: This paper presents a new approach to the derivation of decentralized plug-and-play stability certificates that can be calculated using black-box admittance spectra, without requiring white-box models of devices. The method is based on analysing the properties of the nodal admittance matrix. The certificates ensure that the devices can be connected at any node of a network of any topology as long as the R/X ratio is within a specified range. The approach is related to the passivity concept, but uses frequency-dependent transformation matrices to check if a device, which is non-passive in a certain frequency range, can still satisfy a plug-and-play stability criterion. We illustrate the method using Grid Forming Inverters (GFMs) connected to IEEE 39 node test-case.

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