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AlV2_2O4_4 thin films via in-situ interfacial topotaxy

Published 25 Aug 2026 in cond-mat.mtrl-sci | (2608.24821v1)

Abstract: Conventional oxide epitaxy approaches face challenges when the oxidation conditions of constituent elements differ significantly. Here we demonstrate that V--O thin films can serve as solid-phase precursors for epitaxial AlV2_2O4_4, comprising a pyrochlore V<sup>2.5+<sup>{2.5+} network coexisting with AlO4_4 tetrahedra within the spinel structure. The epitaxial AlV2_2O4_4/Al2_2O3_3 (0001) heterostructures are realized via interfacial topotactic transformation, involving V--O growth at a moderate temperature followed by in-situ ultra-high-temperature post-annealing to drive a reaction with the Al2_2O3_3 substrate. Transmission electron microscopy and temperature-dependent X-ray diffraction analyses reveal excellent structural characteristics that closely reproduce the known charge-ordering transition. This study presents a novel approach to realizing epitaxial structures with convoluted oxidation states where thermodynamic and kinetic barriers would otherwise limit synthesizability.

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