Papers
Topics
Authors
Recent
Search
2000 character limit reached

Trait-space Monitoring for Emergent Misalignment During Supervised Finetuning

Published 31 May 2026 in cs.LG, cs.AI, and cs.CY | (2606.07631v1)

Abstract: Emergent misalignment (EM) occurs when narrow finetuning causes a model to behave dangerously outside the finetuning task. Standard training signals can miss this shift, making reliable detection costly if it depends on repeated behavioral evaluation. We ask whether emergent misalignment can instead be detected from internal representations during finetuning. Using seven alignment-relevant traits encoded as linear directions in activation space, we track representational drift across training checkpoints in four open-source 7-9B LLMs. EM-relevant drift concentrates on a low-dimensional axis that explains 65.5% of the variance, revealing a geometric signature in the studied regime. A low-overhead monitor built on this drift profile detects dangerous checkpoints with 2.2% false negative rate, 2.9% false positive rate, and 0.990 AUROC on held-out perturbation types, outperforming unsupervised PCA and SAE baselines. Stress tests on two 14B models, longer finetuning runs, and misaligned starting points identify key deployment boundaries. These results position trait-space monitoring as a practical complement to behavioral evaluation for EM detection during LoRA-based finetuning, while showing that deployment across substantially different regimes may require recalibration.

Summary

No one has generated a summary of this paper yet.

Paper to Video (Beta)

No one has generated a video about this paper yet.

Whiteboard

No one has generated a whiteboard explanation for this paper yet.

Open Problems

We haven't generated a list of open problems mentioned in this paper yet.

Continue Learning

We haven't generated follow-up questions for this paper yet.

Collections

Sign up for free to add this paper to one or more collections.

Tweets

Sign up for free to view the 1 tweet with 27 likes about this paper.