Measuring Uncertainty in Transformer Circuits with Effective Information Consistency

Abstract: Mechanistic interpretability has identified functional subgraphs within LLMs, known as Transformer Circuits (TCs), that appear to implement specific algorithms. Yet we lack a formal, single-pass way to quantify when an active circuit is behaving coherently and thus likely trustworthy. Building on prior systems-theoretic proposals, we specialize a sheaf/cohomology and causal emergence perspective to TCs and introduce the Effective-Information Consistency Score (EICS). EICS combines (i) a normalized sheaf inconsistency computed from local Jacobians and activations, with (ii) a Gaussian EI proxy for circuit-level causal emergence derived from the same forward state. The construction is white-box, single-pass, and makes units explicit so that the score is dimensionless. We further provide practical guidance on score interpretation, computational overhead (with fast and exact modes), and a toy sanity-check analysis. Empirical validation on LLM tasks is deferred.