An indirect correlation of dielectric properties using optical trapping and dielectric resonance in two different frequency regimes

Abstract: Dielectric permittivity, $\varepsilon_r$, of materials are often limited to a sub-GHz range using normal LCR meters. In the GHz range the $\varepsilon_r$ can be measured using Vector Network Analyzers and measurement jigs (waveguides) which are specific for different frequency regimes. Hence, to measure er for the entire frequency range one needs several components and is an extremely costly experiment. However, for applications such as Dielectric Resonator Antennas one need to know the er and the dielectric loss to estimate the resonant frequency. An indirect method is proposed in this letter to find the er from Transversely Misaligned Dual-Fiber Optical Trapping at the optical frequency range to approximately estimate {\epsilon}r and thereby understand the correlation between these two regimes of frequency responses.