Sample Complexity of the Sign-Perturbed Sums Method

Abstract: We study the sample complexity of the Sign-Perturbed Sums (SPS) method, which constructs exact, non-asymptotic confidence regions for the true system parameters under mild statistical assumptions, such as independent and symmetric noise terms. The standard version of SPS deals with linear regression problems, however, it can be generalized to stochastic linear (dynamical) systems, even with closed-loop setups, and to nonlinear and nonparametric problems, as well. Although the strong consistency of the method was rigorously proven, the sample complexity of the algorithm was only analyzed so far for scalar linear regression problems. In this paper we study the sample complexity of SPS for general linear regression problems. We establish high probability upper bounds for the diameters of SPS confidence regions for finite sample sizes and show that the SPS regions shrink at the same, optimal rate as the classical asymptotic confidence ellipsoids. Finally, the difference between the theoretical bounds and the empirical sizes of SPS confidence regions is investigated experimentally.