Optical Rectification and Electro-Optic Sampling in Quartz (2209.01153v1)

Abstract: We report electro-optic sampling (EOS) response and terahertz (THz) optical rectification (OR) in z-cut alpha-quartz. Due to its small effective second-order nonlinearity, echo-free waveform of intense THz pulses with a few MV/cm electric-field strength can be measured faithfully with no saturation effect. Both its OR and EOS responses are broad with extension up to ~8 THz. Strikingly, the latter responses are independent of the crystal thickness, a plausible indication of strong surface contribution to the total second-order nonlinear susceptibility of quartz. Our study introduces thin quartz plates as the reliable THz electro-optic medium for echo-free, high field THz detection.