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IEC Flickermeter Measurement Results for Distorted Modulating Signal while Supplied with Distorted Voltage

Published 10 Feb 2022 in eess.SP, cs.NA, and math.NA | (2202.05001v2)

Abstract: The paper presents IEC flickermeter measurement results for voltage fluctuations modelled by amplitude modulation of distorted supply voltage. The supply voltage distortion caused by electronic and power electronic devices in the "clipped cosine" form is assumed. This type of supply voltage distortion is a common disturbance in low voltage networks. Several arbitrary distorted waveforms of the modulating signal with different modulation depth and modulating frequency up to approx. 1 kHz are selected to determine the dependence of severity of voltage fluctuation on their shape. The paper mainly presents the dependence of voltage fluctuation severity with a frequency greater than 3fc, where fc is the power frequency. The voltage fluctuation severity and the dependencies associated with it have been determined on the basis of numerical simulation studies and experimental laboratory tests.

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