Sampling linear inverse problems with noise

Abstract: We study the effect of additive noise to the inversion of FIOs associated to a diffeomorphic canonical relation. We use the microlocal defect measures to measure the power spectrum of the noise and analyze how that power spectrum is transformed under the inversion. In particular, we compute the standard deviation of the noise added to the inversion as a function of the standard deviation of the noise added to the data. As an example, we study the Radon transform in the plane in parallel and fan-beam coordinates, and present numerical examples.