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Matrix method for thin film optics
Published 20 Sep 2018 in physics.optics | (1809.07708v1)
Abstract: Review of a matrix method used in optics of thin films for the calculation of reflectance, transmittance, absorptance, the electric field distribution inside the stack and the photonic dispersion considering the stack as perfect unidimensional crystals -Distributed Bragg mirrors-. We emphasizes the discussion on transfer matrices and give an alternative approach with scattering matrices for the propagation of light as plane waves through a homogeneous layered system.
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