Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa$_2$Cu$_3$O$_{7-δ}$ thin films

Abstract: We have discovered two novel types of planar defects that appear in heteroepitaxial YBa$2$Cu$_3$O${7-\delta}$ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La${2/3}$Ca${1/3}$MnO$_3$ (LCMO) overlayer, using the combination of high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping for unambiguous identification. These planar lattice defects are based on the intergrowth of either a BaO plane between two CuO chains or multiple Y-O layers between two CuO$_2$ planes, resulting in non-stoichiometric layer sequences that could directly impact the high-$T_c$ superconductivity.