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Regression Model With Elliptically Contoured Errors

Published 20 Mar 2012 in math.ST, stat.ME, and stat.TH | (1203.4427v1)

Abstract: For the regression model where the errors follow the elliptically contoured distribution (ECD), we consider the least squares (LS), restricted LS (RLS), preliminary test (PT), Stein-type shrinkage (S) and positive-rule shrinkage (PRS) estimators for the regression parameters. We compare the quadratic risks of the estimators to determine the relative dominance properties of the five estimators.

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