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Electronic phase transitions in Pr$_{0.5}$Ca$_{0.5}$MnO$_3$ epitaxial thin films revealed by resonant soft x-ray scattering

Published 21 Nov 2011 in cond-mat.str-el and cond-mat.mtrl-sci | (1111.4725v1)

Abstract: We report the study of magnetic and orbital order in Pr${0.5}$Ca${0.5}$MnO$3$ epitaxial thin films grown on (LaAlO$_3$)${0.3}$-(SrAl${0.5}$Ta${0.5}$O$3$)${0.7}$ (LSAT) (011)$_c$. In a new experimental approach, the polarization and energy dependence of resonant soft x-ray scattering are used to reveal significant modifications of the magnetic order in the film as compared to the bulk, namely (i) a different magnetic ordering wave vector, (ii) a different magnetic easy axis and (iii) an additional magnetic reordering transition at low temperatures. These observations indicate a strong impact of the epitaxial strain on the spin order, which is mediated by the orbital degrees of freedom and which provides a promising route to tune the magnetic properties of manganite films. Our results further demonstrate that resonant soft x-ray scattering is a very suitable technique to study the magnetism in thin films, to which neutron scattering cannot easily be applied due to the small sample volume.

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