Microscopic origin of preferred vortex-trapping sites
Determine the relative importance of local topography, film-thickness variation, stress, spatial variations in superconducting properties, layer-dependent superconducting transition behavior, and cooldown-induced thermal gradients in producing the preferred Pearl-vortex trapping sites near via arrays and layer boundaries in multilayer superconducting circuits, and identify their microscopic origin.
References
While the Figs.~\ref{fig5} and Figs.~\ref{fig6} establish a clear correlation between preferred trapping sites and the multilayer device geometry, rather than with the moat geometry alone, the microscopic origin of these preferred sites remains unclear, and several mechanisms may contribute. The via arrays and layer transition can introduce local topography, film-thickness variation, or stress, leading to spatial variation in the superconducting properties that can modify the local vortex-pinning energy. In addition, thermal gradient during cooldown, together with variations in the superconducting properties and critical temperatures among layers may cause some layers to become superconducting before others. The geometry of the layers that have already transitioned may dominate the available paths for flux expulsion and trapping, thereby modifying the eventual vortex locations. Determining the relative importance of these effects and the microscopic origin of the preferred trapping sites will require further investigation.