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Cause of Poor Performance of Noise-Free Baseline

Determine the exact cause of the poor performance of the noise-free baseline pulse predictor that computes pulse time using a noise-free memristor model (unaffected by cycle-to-cycle noise) to achieve a desired conductance change ΔG, when applied to conductance programming with the JART valence change mechanism (VCM) memristor model. Ascertain whether the self-accelerating switching dynamics of SET/RESET and asymmetric noise effects are responsible for the observed degradation.

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Background

The paper evaluates neural networks that predict programming pulse times for memristors modeled using the JART VCM model, and compares them against a baseline that uses a noise-free model to compute pulse duration for a desired conductance change. In simulation, the trained neural predictors outperform the noise-free baseline across much of the operating range.

In the Discussion section, the authors explicitly state that the noise-free baseline performs poorly and that the exact reason is unclear. They hypothesize that self-accelerating switching dynamics and asymmetric noise impacts may introduce biases that degrade the baseline’s effectiveness, but the definitive cause remains unresolved.

References

In Sec.~\ref{sec:training}, the noise-free baseline exhibits poor performance. The exact reason for this remains unclear, but could be linked to the switching dynamics discussed in Sec.~\ref{sec:training}, where injected noises could further assist the self-accelerating switching processes, and introduce biases in the predictions.

The Ouroboros of Memristors: Neural Networks Facilitating Memristor Programming (2403.06712 - Yu et al., 11 Mar 2024) in Section 6, Discussion: Poor Performance of Noise-free Model