Papers
Topics
Authors
Recent
Search
2000 character limit reached

Key Feature Replacement of In-Distribution Samples for Out-of-Distribution Detection

Published 26 Dec 2022 in cs.CV, cs.AI, and cs.LG | (2301.13012v1)

Abstract: Out-of-distribution (OOD) detection can be used in deep learning-based applications to reject outlier samples from being unreliably classified by deep neural networks. Learning to classify between OOD and in-distribution samples is difficult because data comprising the former is extremely diverse. It has been observed that an auxiliary OOD dataset is most effective in training a "rejection" network when its samples are semantically similar to in-distribution images. We first deduce that OOD images are perceived by a deep neural network to be semantically similar to in-distribution samples when they share a common background, as deep networks are observed to incorrectly classify such images with high confidence. We then propose a simple yet effective Key In-distribution feature Replacement BY inpainting (KIRBY) procedure that constructs a surrogate OOD dataset by replacing class-discriminative features of in-distribution samples with marginal background features. The procedure can be implemented using off-the-shelf vision algorithms, where each step within the algorithm is shown to make the surrogate data increasingly similar to in-distribution data. Design choices in each step are studied extensively, and an exhaustive comparison with state-of-the-art algorithms demonstrates KIRBY's competitiveness on various benchmarks.

Citations (2)

Summary

Paper to Video (Beta)

Whiteboard

No one has generated a whiteboard explanation for this paper yet.

Open Problems

We haven't generated a list of open problems mentioned in this paper yet.

Continue Learning

We haven't generated follow-up questions for this paper yet.

Collections

Sign up for free to add this paper to one or more collections.