Layer stripping approach to reconstruct shape defects in waveguides using locally resonant frequencies

Abstract: This article present a new method to reconstruct slowly varying width defects in 2D waveguides using one-side section measurements at locally resonant frequencies. At these frequencies, locally resonant modes propagate in the waveguide up to a "cut-off" position. In this particular point, the local width of the waveguide can be recovered. Given multi-frequency measurements taken on a section of the waveguide, we perform an efficient layer stripping approach to recover shape variations slice by slice. It provides an L infinite-stable method to reconstruct the width of a slowly monotonous varying waveguide. We validate this method on numerical data and discuss its limits.