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Usage of Scherrer's formula in X-ray diffraction analysis of size distribution in systems of monocrystalline nanoparticles (1911.00701v1)
Published 2 Nov 2019 in cond-mat.mtrl-sci
Abstract: In the supporting information file of the article Controlled Formation and Growth Kinetics of Phase-Pure, Crystalline BiFeO3 Nanoparticles (Crystal Growth & Design 2019), there is a description on how to use Scherrer equation for in situ X-ray diffraction analysis of crystallization processes investigated in the article. That description led to a necessary revaluation on the current understanding of the usage of Scherrer equation for analyzing size distributions, as discussed in this work.