Increasing Flash Memory Lifetime by Dynamic Voltage Allocation for Constant Mutual Information (1403.4333v1)

Abstract: The read channel in Flash memory systems degrades over time because the Fowler-Nordheim tunneling used to apply charge to the floating gate eventually compromises the integrity of the cell because of tunnel oxide degradation. While degradation is commonly measured in the number of program/erase cycles experienced by a cell, the degradation is proportional to the number of electrons forced into the floating gate and later released by the erasing process. By managing the amount of charge written to the floating gate to maintain a constant read-channel mutual information, Flash lifetime can be extended. This paper proposes an overall system approach based on information theory to extend the lifetime of a flash memory device. Using the instantaneous storage capacity of a noisy flash memory channel, our approach allocates the read voltage of flash cell dynamically as it wears out gradually over time. A practical estimation of the instantaneous capacity is also proposed based on soft information via multiple reads of the memory cells.