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QHR Model in Electrical Metrology

Updated 16 August 2025
  • QHR Model is a quantum metrology framework that quantizes electrical resistance using the quantum Hall effect in 2D materials like graphene and GaAs.
  • It leverages advanced measurement infrastructures such as Cryogenic and Direct Current Comparators to achieve ultra-low uncertainties in resistance standards.
  • The model integrates array architectures and star-mesh network transformations to extend resistance ranges and enable programmable quantum current and voltage standards.

The QHR model occupies a central place in quantum electrical metrology, providing the theoretical and experimental framework for quantizing electrical resistance based on the quantum Hall effect (QHE). The model underlies the definition and realization of the ohm within the International System of Units (SI), leveraging graphene and GaAs heterostructures as quantum Hall resistance devices. It also interfaces with advanced metrological constructs such as programmable quantum current standards and star-mesh resistance network transformations, extending both the precision and versatility of electrical standards.

1. Theoretical Foundation: Quantization of Hall Resistance

The quantum Hall resistance (QHR) model is governed by the quantization of Hall resistance observed in two-dimensional electron systems under high magnetic fields and low temperatures. The quantization relation is expressed as:

RH=hνe2R_H = \frac{h}{\nu e^2}

where hh is Planck’s constant, ee the elementary charge, and ν\nu the Landau level filling factor (integer for GaAs; half-integer multiples for graphene).

In epitaxial graphene, the ν=2\nu = 2 (or i=2i = 2) plateau yields

RH=h2e212.906kΩ,R_H = \frac{h}{2e^2} \approx 12.906\,\text{k}\Omega,

providing the resistance standard for SI dissemination. The model relies on the dissipationless nature of edge state transport in the QHE regime and uses four-terminal measurement geometries to separate Hall (RxyR_{xy}) and longitudinal (RxxR_{xx}) resistances. The robust quantization is evident even at relatively modest fields (2–8 T in graphene at 1.5 K) and is verified via high-precision instruments such as the Cryogenic Current Comparator (CCC) resistance bridge (Satrapinski et al., 2013, Novikov et al., 2014, Rigosi, 2022).

2. Device Physics and Metrology: Materials and Measurement Infrastructure

The QHR model’s realization in practical devices requires optimized two-dimensional materials and sophisticated measurement infrastructure:

  • Materials:
    • Exfoliated graphene achieves high mobility but suffers from low breakdown currents (~1 μA), limiting its utility for standards.
    • Epitaxial graphene (EG) grown on SiC offers superior scalability, higher breakdown currents (up to ~100 μA), enhanced Fermi level pinning, and device uniformity, supporting robust quantization over large areas and facilitating precision measurements at elevated temperatures (up to 10 K) (Rigosi, 2022).
    • GaAs/AlGaAs heterostructures are the traditional platform but are progressively being surpassed by graphene systems.
  • Measurement Infrastructure:
    • Cryogenic Current Comparator (CCC): Delivers ultra-low uncertainty (< 4×1084 \times 10^{-8}) in comparing quantum resistance values (Satrapinski et al., 2013, Novikov et al., 2014).
    • Direct Current Comparator (DCC): Optimized for graphene QHR devices to facilitate more accessible comparisons without cryogens (Rigosi, 2022, Rigosi, 2022).
    • Superconducting Contacts: Crucial in large arrays to maintain low contact resistances and support high-precision operation in series/parallel configurations (Jarrett et al., 2023).

Device engineering advances, such as polymer-assisted sublimation growth, double metallization, and the use of pn-junctions or top gates, further enhance performance and scalability (Rigosi, 2022, Jarrett et al., 2023).

3. Carrier Density Engineering and Plateau Optimization

The flatness and robustness of the QHR plateau are highly sensitive to the carrier concentration and its uniformity in the device:

  • Photochemical Gating: Application of UV irradiation in combination with polymer films enables controlled reduction of carrier density through the generation of Cl radicals, yielding wider and more stable quantized plateaus at lower BB fields (Novikov et al., 2014).
  • Thermal Annealing: Employed to fine-tune or restore carrier concentration when over-reduction occurs post-illumination.
  • Top Gating and p–n Junction Technology: Integration of tunable gates produces sharp pn-junctions, enabling precise modulation across device regions, crucial for both single Hall bars and array devices (Rigosi, 2022).

Carrier concentration is monitored using:

nc=1e1dRxydBn_c = \frac{1}{e} \frac{1}{\frac{dR_{xy}}{dB}}

Optimizing ncn_c minimizes Landau level broadening, reduces RxxR_{xx}, and suppresses quantization deviations, with the best uncertainties realized near the ν=2\nu = 2 plateau (3\sim 3 nΩ/Ω) (Novikov et al., 2014, Satrapinski et al., 2013).

4. Array Architectures and the Star-Mesh Transformation

To cover a broad resistance range, the QHR model extends beyond single Hall bars to array architectures:

  • Series/Parallel Arrays: Enable resistance standards from 1 kΩ to 1.29 MΩ via controlled interconnection of many Hall bars, leveraging the additive and reciprocal properties of resistance in series and parallel (Jarrett et al., 2023).
  • Star-Mesh (Y–Δ) Network Transformation: Mathematical techniques such as the wye-delta transformation are applied to QHARS arrays, dramatically increasing the effective resistance without requiring a proportional increase in the number of elements. For example, a 1.01 MΩ\Omega QHARS can be transformed into \sim20.6 MΩ\Omega using the formula:

Req=R1R2+R2R0+R1R0R0R_{eq} = \frac{R_1 R_2 + R_2 R_0 + R_1 R_0}{R_0}

where R1R_1 and R2R_2 are “Hi” and “Lo” arms, R0R_0 the “ground” arm. This allows scaling into the 100 MΩ\Omega and 10 GΩ\Omega regimes, optimizing calibration chains for high-resistance metrology (Jarrett et al., 2023).

  • Programmable and Multi-Value Standards: Array design enables programmable access to various quantized resistances, including binary fractions or higher filling factor plateaus (e.g., ν=6,10\nu = 6, 10), although the highest precision remains associated with ν=2\nu = 2 (Rigosi, 2022).

5. Quantum Hall Resistance in System-Level Quantum Metrology

The QHR model is integral to more complex quantum metrological systems:

  • Programmable Quantum Current Standard (PQCS):
    • Combines the QHR device and the programmable Josephson voltage array (PJAVS) through multiple connections and the CCC.
    • Generates a quantized current I=VJ/RHI = V_J / R_H, with uncertainties <109< 10^{-9}, and is a foundation for programmable ampere standards (Poirier et al., 2013).
    • Plays a critical role in the quantum metrological triangle (QMT), linking voltage (Josephson effect), resistance (QHR), and current (single-electron pump). The relationship is formalized as

    RKKJQ=nJnQNJKNfJfPumpR_K K_J Q = \frac{n_J}{n_Q} \frac{N_{JK}}{N} \frac{f_J}{f_{Pump}}

    enabling stringent tests of the universality of the QHE and consistency of fundamental constants.

  • Universality Tests: Direct comparison of QHR devices fabricated from different materials (e.g., graphene vs. GaAs) validates that quantized resistance depends solely on hh and ee to within a few parts in 101110^{11} (Poirier et al., 2013, Rigosi, 2022).

6. Metrological Impact and Future Directions

The QHR model’s evolution has had broad implications for electrical standards and the future SI:

  • Redefined SI: QHR-based devices are foundational to the ohm’s current definition directly in terms of hh and ee (Rigosi, 2022). Their robust operation at accessible temperatures and high currents has democratized access to high-precision metrology.

  • Resistance Standard Dissemination: Table-top, cryogen-free QHR systems (especially those using EG) now permit routine standard dissemination outside national laboratories.

  • Calibration Chain Optimization: Star-mesh QHR arrays facilitate direct quantum realization of resistance across the calibration hierarchy, reducing the need for intermediate, conventional resistive standards (Jarrett et al., 2023).

  • Research Directions:

    • Exploratory work on higher Landau-level plateaus aims to expand the accessible quantized resistance values, though current precision at ν=6,10\nu = 6, 10 remains inferior to ν=2\nu = 2 (Rigosi, 2022).
    • Upgrades in interconnection technology (e.g., superconducting splits, pn-junctions) target enhanced device scalability and minimized uncertainty.
    • Integration with quantum voltage and current standards is advancing unified programmable SI electrical metrology (Poirier et al., 2013).

7. Summary Table: QHR Device Comparison

Device Type Plateau (ν\nu) Breakdown Current Typical Precision
Exfoliated Graphene 2 \sim1 μA Limited by current
Epitaxial Graphene 2 40–100 μA down to 3 nΩ/Ω
GaAs/AlGaAs 2 20–80 μA best: few parts in 101110^{-11}

Epitaxial graphene QHR devices provide an optimal balance of scalability, robustness, and quantization accuracy. They now underpin most new quantum-based resistance standards.


The QHR model achieves robust reproducibility of quantized resistance across a variety of device architectures and materials, attaining uncertainties suitable for the SI system and enabling advanced metrological applications through programmable, scalable, and directly quantum-traceable implementations.

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