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Lit Silicon: A Case Where Thermal Imbalance Couples Concurrent Execution in Multiple GPUs (2511.09861v1)

Published 13 Nov 2025 in cs.DC and cs.AR

Abstract: GPU systems are increasingly powering modern datacenters at scale. Despite being highly performant, GPU systems suffer from performance variation at the node and cluster levels. Such performance variation significantly impacts both high-performance computing and artificial intelligence workloads, such as cutting-edge LLMs. We analyze the performance of a single-node multi-GPU system running LLM training, and observe that the kernel-level performance variation is highly correlated with concurrent computation communication (C3), a technique to overlap computation and communication across GPUs for performance gains. We then take a further step to reason that thermally induced straggling coupling with C3 impacts performance variation, coined as the Lit Silicon effect. Lit Silicon describes that in a multi-GPU node, thermal imbalance across GPUs introduces node-level straggler GPUs, which in turn slow down the leader GPUs. Lit Silicon leads to node-level performance variation and inefficiency, impacting the entire datacenter from the bottom up. We propose analytical performance and power models for Lit Silicon, to understand the potential system-level gains. We further design simple detection and mitigation techniques to effectively address the Lit Silicon problem, and evaluate three different power management solutions, including power optimization under GPU thermal design power, performance optimization under node-level GPU power capping, and performance optimization under node-level CPU power sloshing. We conduct experiments on two workloads on two AMD InstinctTM MI300X GPU systems under two LLM training frameworks, and observe up to 6% performance and 4% power improvements, potentially saving hundreds of millions of dollars in datacenters. Our solution is almost free lunch and can be effortlessly adopted in datacenters as a new node-level power management layer.

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