Storage and retrieval of von Neumann measurements

Abstract: This work examines the problem of learning an unknown von Neumann measurement of dimension $d$ from a finite number of copies. To obtain a faithful approximation of the given measurement we are allowed to use it $N$ times. Our main goal is to estimate the asymptotic behavior of the maximum value of the average fidelity function $F_d$ for a general $N \rightarrow 1$ learning scheme. We show that $F_d = 1 - \Theta\left(\frac{1}{N^2}\right)$ for arbitrary but fixed dimension $d$. In addition to that, we compared various learning schemes for $d=2$. We observed that the learning scheme based on deterministic port-based teleportation is asymptotically optimal but performs poorly for low $N$. In particular, we discovered a parallel learning scheme, which despite its lack of asymptotic optimality, provides a high value of the fidelity for low values of $N$ and uses only two-qubit entangled memory states.