IETI-DP for conforming multi-patch Isogeometric Analysis in three dimensions

Abstract: We consider dual-primal isogeometric tearing and interconnection (IETI-DP) solvers for multi-patch geometries in Isogeometric Analysis. Recently, the authors have published a convergence analysis for those solvers that is explicit in both the grid size and the spline degree for conforming discretizations of two dimensional computational domains. In the present paper, we shortly revisit these results and provide numerical experiments that indicate that similar results may hold for three dimensional domains.