Design of SEC-DED and SEC-DED-DAEC Codes of different lengths (2002.07507v1)

Abstract: Reliability is an important requirement for both communication and storage systems. Due to continuous scale down of technology multiple adjacent bits error probability increases. The data may be corrupted due soft errors. Error correction codes are used to detect and correct the errors. In this paper, design of single error correction-double error detection (SEC-DED) and single error correction-double error detection-double adjacent error correction (SEC-DED-DAEC) codes of different data lengths have been proposed. Proposed SEC-DED and SEC-DED-DAEC codes require lower delay and power compared to existing coding schemes. Area complexity in terms of logic gates of proposed and existing codes have been presented. ASIC-based synthesis results show a notable reduction compared to existing SEC-DED codes. All the codec architectures are synthesized on ASIC platform. Performances of different SEC-DED-DAEC codes are tabulated in terms of area, power and delay.