Position measurement and the Huygens-Fresnel principle: A quantum model of Fraunhofer diffraction for polarized pure states (1710.09758v7)

Abstract: In most theories of diffraction by a diaphragm, the amplitude of the diffracted wave, and hence the position wave function of the associated particle, is calculated directly without prior calculation of the quantum state. Few models express the state of the particle to then deduce the position and momentum wave functions related to the diffracted wave. We present a model of this type for Fraunhofer diffraction. The diaphragm is assumed to be a device for measuring the three spatial coordinates of the particles passing through the aperture. A matrix similar to the S-matrix of the scattering theory describes the process which turns out to be more complex than a simple position measurement. Some predictions can be tested. The wavelets emission involved in the Huygens-Fresnel principle occurs from several neighboring wavefronts instead of just one, causing typical damping of the diffracted wave intensity. An angular factor plausibly accounts for the decrease in intensity at large diffraction angles, unlike the obliquity factors of the wave optics theories. The position measurement modifies the polarization states and for an incident photon in an elliptically polarized pure state, the ellipse axes can undergo a rotation which depends on the diffraction angles.