Uniqueness of Hubbard parameter identification from charge stability diagrams
Determine whether the collection of charge stability diagrams measured for nearest-neighbor pairs of semiconductor quantum dots over varying local chemical potentials uniquely determines the site-dependent parameters of the extended Hubbard model—specifically the hopping amplitudes t_ij, on-site energies ε_i, inter-site Coulomb repulsions V_ij, and on-site Coulomb repulsions U_i—thereby establishing the injectivity of the mapping from aggregated stability-diagram data to the full Hamiltonian parameter set.
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This is crucial because it is not immediately clear if the collection of charge stability diagrams we feed in can uniquely determine the Hubbard parameters in the first place since there is no 'inverse scattering' theorem proven for such a scenario.