Identify and quantify the sources of uncertainty underlying low p-values in SThM calibration fits

Ascertain whether the very low p-values obtained when fitting the Scanning Thermal Microscopy calibration model Y = ak/(b + k) + c to measured data arise from misspecification of the calibration-curve expression versus underestimation of measurement and processing uncertainties, and quantitatively characterize the corresponding uncertainty contributions to enable correct uncertainty evaluation.

Background

Within the Results section, the authors report that all calibration-curve fits exhibit very low p-values. They interpret this as indicating either a model misspecification (i.e., inadequacy of the chosen calibration function Y = ak/(b + k) + c) or substantially underestimated uncertainties in the measurement and processing steps.

They explicitly state that the source of these uncertainties and their quantification are currently unclear. Resolving this requires determining whether the functional form is inadequate, identifying the dominant uncertainty sources (e.g., drift, tip–sample interactions, image-related artifacts), and developing a rigorous quantitative description to incorporate them into the uncertainty evaluation.