A stochastic approximate expectation-maximization for structure determination directly from cryo-EM micrographs

Abstract: A single-particle cryo-electron microscopy (cryo-EM) measurement, called a micrograph, consists of multiple two-dimensional tomographic projections of a three-dimensional molecular structure at unknown locations, taken under unknown viewing directions. All existing cryo-EM algorithmic pipelines first locate and extract the projection images, and then reconstruct the structure from the extracted images. However, if the molecular structure is small, the signal-to-noise ratio (SNR) of the data is very low, and thus accurate detection of projection images within the micrograph is challenging. Consequently, all standard techniques fail in low-SNR regimes. To recover molecular structures from measurements of low SNR, and in particular small molecular structures, we devise a stochastic approximate expectation-maximization algorithm to estimate the three-dimensional structure directly from the micrograph, bypassing locating the projection images. We corroborate our computational scheme with numerical experiments, and present successful structure recoveries from simulated noisy measurements.