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Fidelity based Measurement Induced Nonlocality over two-sided measurements
Published 15 Feb 2018 in quant-ph | (1802.05660v1)
Abstract: In this paper, we introduce quantum fidelity based measurement induced nonlocality for the bipartite state over two-sided von Neumann projective measurements. While all the properties of this quantity are reflected from that of one-sided measurement, the latter one is shown to set an upper bound for arbitrary bipartite state. As an illustration, we have studied the nonlocality of Bell diagonal state.
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