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High mobility conduction at (110) and (111) LaAlO3/SrTiO3 interfaces (1210.7955v1)

Published 30 Oct 2012 in cond-mat.mtrl-sci and cond-mat.str-el

Abstract: In recent years, striking discoveries have revealed that two-dimensional electron liquids (2DEL) confined at the interface between oxide band-insulators can be engineered to display a high mobility transport. The recognition that only few interfaces appear to suit hosting 2DEL is intriguing and challenges the understanding of these emerging properties not existing in bulk. Indeed, only the neutral TiO2 surface of (001)SrTiO3 has been shown to sustain 2DEL. We show that this restriction can be surpassed: (110) and (111) surfaces of SrTiO3 interfaced with epitaxial LaAlO3 layers, above a critical thickness, display 2DEL transport with mobilities similar to those of (001)SrTiO3. Moreover we show that epitaxial interfaces are not a prerequisite: conducting (110) interfaces with amorphous LaAlO3 and other oxides can also be prepared. These findings open a new perspective both for materials research and for elucidating the ultimate microscopic mechanism of carrier doping.

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Summary

High Mobility Conduction at Non-standard LaAlO3/SrTiO3 Interfaces

The paper investigates the occurrence of high mobility conduction at (110) and (111) LaAlO₃/SrTiO₃ interfaces, challenging the previously established notion that such conduction was predominantly confined to (001) oriented interfaces. The research explores these interfaces both in epitaxial and amorphous forms, opening new pathways for understanding and harnessing conduction phenomena in oxide heterostructures.

Summary of Findings

This paper demonstrates that high mobility two-dimensional electron liquids (2DEL) are not exclusive to (001) oriented LaAlO₃/SrTiO₃ interfaces. It identifies similar conductive behavior in (110) and (111) oriented interfaces once an epitaxial LaAlO₃ layer exceeds a critical thickness. Notably, conductance transitions occur at 7 MLs and 9 MLs for (110) and (111) orientations, respectively. Sheet carrier densities and electronic mobilities reached values comparable to those of the established (001) interfaces, with a sheet carrier density up to 10¹⁴ cm⁻² and mobilities nearing 2500 cm²/Vs.

Furthermore, the paper presents findings that amorphous LaAlO₃ layers and other oxide films, such as STO and YSZ, at the (110) interface, also exhibit metallic conductance. This observation suggests that polar discontinuity, traditionally considered essential for metallic behavior at these interfaces, might not be the dominant factor, encouraging a reevaluation of interface electrostatic and electronic characteristics.

Practical and Theoretical Implications

The ability to induce metallic conductivity across varied orientations and using amorphous films broadens the potential for electronic applications that leverage oxide heterostructures. This understanding potentially influences the design of electronic and optoelectronic devices, particularly where unique properties are desired at reduced dimensions.

Theoretically, the results compel further investigation into mechanisms beyond polar discontinuity, hinting at complexities in charge redistribution and atomic reconstruction at oxide interfaces. The involvement of phenomena like cation intermixing or oxygen depletion during growth processes suggests a layered approach to studying these interactions. Future research might expand this framework to other perovskite oxides with different orbital configurations, such as KTaO₃.

Contribution to Future Research

The paper's findings significantly contribute to the landscape of interface engineering, paving the way for innovative experiments on electronic gases in diverse oxide systems. Researchers are encouraged to explore beyond the traditional epitaxial crystalline layers to include amorphous layers in their experimental designs. This work also hints at the prospect of manipulating electronic properties via cation characteristics or surface modifications rather than relying solely on structural orientation.

In summary, this paper advances the understanding of oxide interface properties, challenging previously held conventions regarding conductivity and structural requirements. It opens new avenues for both practical applications and fundamental research, albeit requiring further exploration into the underpinning interactions at play.

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