Stimulated Raman phase shift spectroscopy: a pathway to hyperfine fingerprint spectra (2403.03417v1)

Abstract: The principle and experimental realization of a novel Raman spectroscopic technique entitled stimulated Raman phase shift (SRPS) spectroscopy was demonstrated. This technique depends on the measurement of the stimulated Raman scattering (SRS) induced phase shift of Stokes light field ($\Delta$ $\phi$) that is related to the real part of the third order nonlinear susceptibility of SRS. In principle, the spectral lineshape of 1/|$\Delta$ $\phi$| is a delta function waveform, which is insensitive to the fluctuation of Stokes light intensity, the decoherence of phonon in materials, as well as the inhomogeneous fluorescence background. In order to measure 1/|$\Delta$ $\phi$|, a SRPS including a Mach-Zender interferometer and a signal processing device was developed. Using the developed spectrometer, the SRPS and stimulated Raman gain (SRG) spectra of neat dimethyl sulfoxide were detected simultaneously. Seven Raman peaks corresponding to specific molecule vibrational and rotational modes were observed in the SRPS spectra, while only two peaks could be identified in the SRG spectra without a priori knowledge. The linewidth of the Raman peak centered at 2913.283 cm$^{-1}$ indicating the v$_s$(CH$_3$)stretching mode of the methyl groups was less than 0.00036 cm$^{-1}$ in the measured SRPS spectra, which was almost four orders of magnitude narrower than that in the measured SRG spectra. Meanwhile, the detection signal-to-noise ratio of the Raman peak centered at 2913.283 cm$^{-1}$ was 25.3 dB, representing an increase of 14.3 dB compared to the SRG spectra. The reliability of SRPS technique was verified by 10 independent measurements, and the standard deviation of the Raman peak frequency was less than $\pm$0.338 cm$^{-1}$. The SRPS technique paves the way for characterizing the hyperfine fingerprint of materials.