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Quantifying Effective Noise Sources in Coupled Resonating MEMS sensors (2109.04800v1)

Published 10 Sep 2021 in eess.SY, cs.SY, and physics.app-ph

Abstract: This paper presents realistic system-level modelling and simulation of effective noise sources in a coupled resonating MEMS sensors. A governing set of differential equations are used to build a numerical model of a mechanical noise source in a coupled-resonator sensor. An effective thermomechanical noise is then quantified through the system-level simulation obtained via Simulink. On a similar note, various noise sources in electronic readout are identified and the contribution of each is quantified to determine an effective noise that stems from the electronic readout. A comparison between an effective mechanical and electronic noise aids in identifying the dominant noise source in a sensor system. A method to optimize the system noise floor for an amplitude-based the readout is presented. The proposed models present a variety of operating conditions, such as finite quality factor, varying coupled electric spring strength, and operation with in-phase and out-of-phase mode. The proposed models aim to determine the impact of fundamental noise processes and thus quantify the ultimate detection limit into a coupled resonating system used for various sensing applications.

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