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A Second-Order Approach to Learning with Instance-Dependent Label Noise (2012.11854v2)

Published 22 Dec 2020 in cs.LG and cs.AI

Abstract: The presence of label noise often misleads the training of deep neural networks. Departing from the recent literature which largely assumes the label noise rate is only determined by the true label class, the errors in human-annotated labels are more likely to be dependent on the difficulty levels of tasks, resulting in settings with instance-dependent label noise. We first provide evidences that the heterogeneous instance-dependent label noise is effectively down-weighting the examples with higher noise rates in a non-uniform way and thus causes imbalances, rendering the strategy of directly applying methods for class-dependent label noise questionable. Built on a recent work peer loss [24], we then propose and study the potentials of a second-order approach that leverages the estimation of several covariance terms defined between the instance-dependent noise rates and the Bayes optimal label. We show that this set of second-order statistics successfully captures the induced imbalances. We further proceed to show that with the help of the estimated second-order statistics, we identify a new loss function whose expected risk of a classifier under instance-dependent label noise is equivalent to a new problem with only class-dependent label noise. This fact allows us to apply existing solutions to handle this better-studied setting. We provide an efficient procedure to estimate these second-order statistics without accessing either ground truth labels or prior knowledge of the noise rates. Experiments on CIFAR10 and CIFAR100 with synthetic instance-dependent label noise and Clothing1M with real-world human label noise verify our approach. Our implementation is available at https://github.com/UCSC-REAL/CAL.

Citations (119)

Summary

  • The paper presents a novel second-order methodology that decouples instance-dependent label noise by leveraging covariance statistics.
  • It introduces a custom loss function that transforms the complex IDN problem into a simpler class-dependent noise scenario to enhance DNN training.
  • Empirical results on datasets like CIFAR10 and Clothing1M demonstrate significant performance gains, such as 79.82% accuracy at 60% noise.

An Examination of Second-Order Approaches to Instance-Dependent Label Noise in Deep Learning

The paper "A Second-Order Approach to Learning with Instance-Dependent Label Noise" offers a novel methodology to address the challenges posed by instance-dependent label noise (IDN) in the training of deep neural networks (DNNs). Conventionally, class-dependent label noise has been the focus of research, but this work shifts the lens towards IDN, which characteristically involves label errors that correlate with the difficulty of the data instances. This complicates the learning process and necessitates more refined approaches than those used for class-dependent noise.

Methodology and Key Contributions

The authors propose a second-order statistical approach, building on the foundational concepts in peer loss research. The central idea is to leverage covariance terms between noise rates and the Bayes optimal label, a technique that uniquely decouples the effects of IDN. This grants the authors the ability to transform a complex instance-dependent problem into a simpler class-dependent noise problem using second-order statistics.

By employing covariance statistics, the paper introduces a new loss function to potentially improve robustness against IDN. They demonstrate that their approach successfully identifies and corrects the imbalance introduced by IDN, mitigating its down-weighting effect on each instance's contribution to the training process. This is particularly pivotal as IDN has been shown to disproportionately affect noisy and difficult-to-classify examples, leading to imbalances in the learning.

Among the paper’s notable results is a performance improvement across datasets such as CIFAR10 and CIFAR100 with synthetic label noise and Clothing1M with real-world label noise. Key statistical methods are outlined for estimating these covariance terms efficiently, even in the absence of ground truth labels or noise rate information.

Empirical Results and Implications

The empirical results present compelling evidence that the proposed methodology outperforms several state-of-the-art alternatives, especially in scenarios with higher noise levels. For instance, at a noise rate of 60% on CIFAR10, the proposed method achieved a test accuracy of 79.82%, significantly higher than methods like generalized cross-entropy or peer loss, which are less effective in such high noise settings.

The implications of this work are vast both theoretically and practically. Theoretically, it strengthens the understanding of covariance roles in statistical learning, particularly in noisy environments. Practically, it opens up pathways for more robust AI applications in scenarios where label noise is unavoidable but needs management—such as in large-scale, human-annotated datasets prevalent in real-world applications including medical imaging and autonomous vehicle systems.

Future Directions

While the proposed methodology addresses currently unmitigated aspects of noise in machine learning datasets, the need for further development is clear. Future research might focus on refining the estimation of covariance terms, exploring alternative methods or combination strategies to achieve more accurate assessments, or generalizing this approach to other noisy conditions and more complex settings. Moreover, understanding the interaction of these methods with semi-supervised learning paradigms, or integrating them into modern LLMs and transformer architectures, could provide fruitful research threads.

In conclusion, the paper presents a well-substantiated second-order approach to IDN in DNNs, offering both theoretical insights and practical triumphs. This work establishes a clear methodological advancement in the ongoing effort to develop noise-resilient deep learning systems.

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