Exploring Domain Wall Pinning in Ferroelectrics via Automated High Throughput AFM (2505.24062v1)

Abstract: Domain-wall dynamics in ferroelectric materials are strongly position-dependent since each polar interface is locked into a unique local microstructure. This necessitates spatially resolved studies of the wall-pinning using scanning-probe microscopy techniques. The pinning centers and preexisting domain walls are usually sparse within image plane, precluding the use of dense hyperspectral imaging modes and requiring time-consuming human experimentation. Here, a large area epitaxial PbTiO$_3$ film on cubic KTaO$_3$ were investigated to quantify the electric field driven dynamics of the polar-strain domain structures using ML-controlled automated Piezoresponse Force Microscopy. Analysis of 1500 switching events reveals that domain wall displacement depends not only on field parameters but also on the local ferroelectric-ferroelastic configuration. For example, twin boundaries in polydomains regions like a$_1^-$/$c^+$ $\parallel$ a$_2^-$/$c^-$ stay pinned up to a certain level of bias magnitude and change only marginally as the bias increases from 20V to 30V, whereas single variant boundaries like a$_2^+$/$c^+$ $\parallel$ a$_2^-$/$c^-$ stack are already activated at 20V. These statistics on the possible ferroelectric and ferroelastic wall orientations, together with the automated, high-throughput AFM workflow, can be distilled into a predictive map that links domain configurations to pulse parameters. This microstructure-specific rule set forms the foundation for designing ferroelectric memories.