Scalable and Efficient Methods for Uncertainty Estimation and Reduction in Deep Learning (2401.07145v1)
Abstract: Neural networks (NNs) can achieved high performance in various fields such as computer vision, and natural language processing. However, deploying NNs in resource-constrained safety-critical systems has challenges due to uncertainty in the prediction caused by out-of-distribution data, and hardware non-idealities. To address the challenges of deploying NNs in resource-constrained safety-critical systems, this paper summarizes the (4th year) PhD thesis work that explores scalable and efficient methods for uncertainty estimation and reduction in deep learning, with a focus on Computation-in-Memory (CIM) using emerging resistive non-volatile memories. We tackle the inherent uncertainties arising from out-of-distribution inputs and hardware non-idealities, crucial in maintaining functional safety in automated decision-making systems. Our approach encompasses problem-aware training algorithms, novel NN topologies, and hardware co-design solutions, including dropout-based \emph{binary} Bayesian Neural Networks leveraging spintronic devices and variational inference techniques. These innovations significantly enhance OOD data detection, inference accuracy, and energy efficiency, thereby contributing to the reliability and robustness of NN implementations.
- Robin Degraeve “Causes and consequences of the stochastic aspect of filamentary RRAM” In Microelectronic Engineering 147 Elsevier, 2015, pp. 171–175
- Dario Amodei “Concrete problems in AI safety” In arXiv preprint arXiv:1606.06565, 2016
- Shimeng Yu “Neuro-inspired computing with emerging nonvolatile memorys” In Proceedings of the IEEE 106.2, 2018, pp. 260–285
- Soyed Tuhin Ahmed “Neuroscrub: Mitigating retention failures using approximate scrubbing in neuromorphic fabric based on resistive memories” In IEEE IEEE European Test Symposium (ETS), 2021
- Albert Reuther “AI accelerator survey and trends” In 2021 IEEE (HPEC), 2021, pp. 1–9 IEEE
- Soyed Tuhin Ahmed “Binary bayesian neural networks for efficient uncertainty estimation leveraging inherent stochasticity of spintronic devices” In NANOARCH’22: 17th ACM International Symposium on Nanoscale Architectures, 2022, pp. 1–6\bibrangessep(Best paper candidate) ACM
- Soyed Tuhin Ahmed “Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking” In 2022 IEEE International Test Conference (ITC), 2022
- Soyed Tuhin Ahmed “Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration” In IEEE 40th VLSI Test Symposium (VTS), 2022, pp. 1–7\bibrangessep(Best paper candidate) IEEE
- Soyed Tuhin Ahmed “NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories” In IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) IEEE, 2022
- Soyed Tuhin Ahmed “Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric” In 2022 IEEE European Test Symposium (ETS), 2022 IEEE
- Soyed Tuhin Ahmed “Design-Time Reference Current Generation for Robust Spintronic-Based Neuromorphic Architecture” In J. Emerg. Technol. Comput. Syst. 20.1 New York, NY, USA: Association for Computing Machinery, 2023 DOI: 10.1145/3625556
- Soyed Tuhin Ahmed “One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection” In Under Review at IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) IEEE, 2023
- “Scalable Spintronics-based Bayesian Neural Network for Uncertainty Estimation” In 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023, pp. 1–6 IEEE
- “Scale-Dropout: Estimating Uncertainty in Deep Neural Networks Using Stochastic Scale” In Under Review at IEEE Transactions on Circuits and Systems I: Regular Papers, 2023
- “Spatial-SpinDrop: Spatial Dropout-based Binary Bayesian Neural Network with Spintronics Implementation” In Under Review at IEEE Transactions on Nanotechnology (TNANO), 2023
- “SpinBayes: Algorithm-Hardware Co-Design for Uncertainty Estimation Using Bayesian In-Memory Approximation on Spintronic-Based Architectures” In ACM Transactions on Embedded Computing Systems 22.5s, 2023 DOI: 10.1145/3609116
- “SpinDrop: Dropout-Based Bayesian Binary Neural Networks With Spintronic Implementation” In IEEE Journal on Emerging and Selected Topics in Circuits and Systems 13.1, 2023, pp. 150–164 DOI: 10.1109/JETCAS.2023.3242146
- Soyed Tuhin Ahmed, Roman Rakhmatullin and Mehdi B Tahoori “Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation” In 2023 IEEE European Test Symposium (ETS), 2023, pp. 1–4 IEEE
- Soyed Tuhin Ahmed and Mehdi B. Tahoori “Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration” In IEEE Design & Test 40.4, 2023, pp. 42–50 DOI: 10.1109/MDAT.2023.3270126
- Soyed Tuhin Ahmed “Concurrent Self-testing of Neural Networks” In Under review at 2024 IEEE 42th VLSI Test Symposium (VTS), 2024, pp. 1–7 IEEE
- Soyed Tuhin Ahmed “Embedding Error Correction Codes in Neural Network Weight using Multi-task Learning” In Under review at 2024 IEEE 42th VLSI Test Symposium (VTS), 2024, pp. 1–7 IEEE
- Soyed Tuhin Ahmed “Enhancing Reliability of Neural Networks at the Edge: Inverted Normalization with Stochastic Affine Transformations” In 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024, pp. 1–6\bibrangessep(Best paper candidate) IEEE