Design of Novel Loss Functions for Deep Learning in X-ray CT

Abstract: Deep learning (DL) shows promise of advantages over conventional signal processing techniques in a variety of imaging applications. The networks' being trained from examples of data rather than explicitly designed allows them to learn signal and noise characteristics to most effectively construct a mapping from corrupted data to higher quality representations. In inverse problems, one has options of applying DL in the domain of the originally captured data, in the transformed domain of the desired final representation, or both. X-ray computed tomography (CT), one of the most valuable tools in medical diagnostics, is already being improved by DL methods. Whether for removal of common quantum noise resulting from the Poisson-distributed photon counts, or for reduction of the ill effects of metal implants on image quality, researchers have begun employing DL widely in CT. The selection of training data is driven quite directly by the corruption on which the focus lies. However, the way in which differences between the target signal and measured data is penalized in training generally follows conventional, pointwise loss functions. This work introduces a creative technique for favoring reconstruction characteristics that are not well described by norms such as mean-squared or mean-absolute error. Particularly in a field such as X-ray CT, where radiologists' subjective preferences in image characteristics are key to acceptance, it may be desirable to penalize differences in DL more creatively. This penalty may be applied in the data domain, here the CT sinogram, or in the reconstructed image. We design loss functions for both shaping and selectively preserving frequency content of the signal.