Consistent Classification with Generalized Metrics (1908.09057v1)

Abstract: We propose a framework for constructing and analyzing multiclass and multioutput classification metrics, i.e., involving multiple, possibly correlated multiclass labels. Our analysis reveals novel insights on the geometry of feasible confusion tensors -- including necessary and sufficient conditions for the equivalence between optimizing an arbitrary non-decomposable metric and learning a weighted classifier. Further, we analyze averaging methodologies commonly used to compute multioutput metrics and characterize the corresponding Bayes optimal classifiers. We show that the plug-in estimator based on this characterization is consistent and is easily implemented as a post-processing rule. Empirical results on synthetic and benchmark datasets support the theoretical findings.