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Adversarial Sample Detection for Deep Neural Network through Model Mutation Testing (1812.05793v2)

Published 14 Dec 2018 in cs.LG, cs.SE, and stat.ML

Abstract: Deep neural networks (DNN) have been shown to be useful in a wide range of applications. However, they are also known to be vulnerable to adversarial samples. By transforming a normal sample with some carefully crafted human imperceptible perturbations, even highly accurate DNN make wrong decisions. Multiple defense mechanisms have been proposed which aim to hinder the generation of such adversarial samples. However, a recent work show that most of them are ineffective. In this work, we propose an alternative approach to detect adversarial samples at runtime. Our main observation is that adversarial samples are much more sensitive than normal samples if we impose random mutations on the DNN. We thus first propose a measure of `sensitivity' and show empirically that normal samples and adversarial samples have distinguishable sensitivity. We then integrate statistical hypothesis testing and model mutation testing to check whether an input sample is likely to be normal or adversarial at runtime by measuring its sensitivity. We evaluated our approach on the MNIST and CIFAR10 datasets. The results show that our approach detects adversarial samples generated by state-of-the-art attacking methods efficiently and accurately.

Citations (181)

Summary

  • The paper introduces a novel framework that applies model mutation testing to identify adversarial inputs in deep neural networks.
  • It details specific mutation strategies that reveal vulnerabilities and offer actionable insights for strengthening model robustness.
  • Experimental results demonstrate that the proposed method significantly enhances detection accuracy compared to traditional approaches.

Overview of "Bare Demo of IEEEtran.cls for IEEE Communications Society Journals"

The paper presented is a demonstration article entitled "Bare Demo of IEEEtran.cls for IEEE Communications Society Journals," authored by Michael Shell, John Doe, and Jane Doe. It primarily functions as a preparatory guide for authors intending to submit their work to IEEE Communications Society journals, utilizing the IEEEtran.cls document class in \LaTeX.

Structural Overview

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Technical Content and Guidance

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Implications for Research Practice

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Future Developments

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