Characterization and control of charge transfer in a tunnel junction (1612.08663v1)

Abstract: Charge transfer in a tunnel junction is studied under dc and ac voltage bias using quantum shot noise. Under dc voltage bias $V$, spectral density of noise measured within a very large bandwidth enables to deduce the current-current correlator in the time domain by Fourier transform. This correlator exhibits regular oscillations proving that electrons try to cross the junction regularly, every $h/eV$. Using harmonic and bi-harmonic ac voltage bias, we then show that quasiparticles excitations can be transferred through the junction in a controlled way. By measuring the reduction of the excess shot noise, we are able to determine the number of electron-hole pairs surrounding the injected electrons and demonstrate that bi-harmonic voltage pulses realize an on-demand electron source with a very small admixture of electron-hole pairs.